Loading ...
P470 - Spherical grating monochromator (SGM) for soft X-ray synchrotron radiation at SCS instrument of the European XFEL, Germany
P470 - Spherical grating monochromator (SGM) for soft X-ray synchrotron radiation at SCS instrument of the European XFEL, Germany

P470 – SGM SCS European XFEL

Application

Spherical grating monochromator (SGM) for soft X-ray synchrotron radiation

Year of delivery

2020

Installation site

SCS instrument of the European XFEL, Germany

This grating unit was developed and built to be integrated into the high energy resolution hRIXS system at SCS instrument of the European XFEL. The challenge was to accomodate all components for standard functionality and for compensation of spectrometer related spurious movements into a very limited space, without perfomance lost.

Design Features

  • Grating unit for high resolution soft X-ray spectrometer.
  • Spectral range: 250 – 1500 eV.
  • Very compact design for integration into the RIXS system.

  • Optical elements: three spherical gratings.
  • Temperature sensors at internal mechanics.
  • Motorized and encoded entrance beam mask with different size apertures.
  • Motorized and encoded vertical translation of the internal mechanics for compensation of spurious height and roll variation upon scattering angle change.
  • Mechanically decoupled internal mechanics from the vacuum chamber.
  • Internal mechanics directly connected to the adjustable support structure underneath.
  • Permanently installed bakeout provisions.

Performance Features

  • High positioning resolution (minimum incremental motion).
  • High pitch rotation stability and repeatability.
  • Minimized mounting induced deformations.

Outer Dimensions

P470 - Outer dimensions - Spherical grating monochromator (SGM) for soft X-ray synchrotron radiation at SCS instrument of the European XFEL, Germany

Technical specifications and performance values

General

Vacuum chamber

Chamber type

rectangular footprint

Main flanges

at the top

Material

1.4404 (C < 0.02%)

Base pressure

10-10 mbar range

Optical design parameters

Beam height (entrance)

1410 mm

Number of gratings

3

Gratings dimensions

220 mm x 50 mm x 50 mm

Grating mechanics

Pitch rotation

Range

-7.30° to +2.53°

Resolution (design value)

0.0036 µrad /motor fine step
(1/64, recommended)
0.0097087 µrad /encoder count

Repeatability

0.13 µrad (pitch)
0.05 µrad (roll)

Long-term stability (1h)

0.06 µrad

Translation (grating exchange)

Range

-73 mm to +73 mm

Resolution (design value)

0.004 µm /motor fine step
(1/64, recommended)
0.05 µm /encoder count

Repeatability

0.32 µrad (pitch)

0.35 µrad (roll)

0.80 µm (position)

Long-term stability (5h)

0.008 µm

Translation (grating height)

Range

-2.24 mm to +2.07 mm
(wedge leveler 1)

-1.14 mm to +2.10 mm
(wedge leveler 2)

Resolution (design value)

0.40 µm /motor step (at actuator)

0.04 µm /motor step
(at wedge leveler)

0.05 µm /encoder count

Repeatability

0.22 µrad (pitch)

0.09 µrad (roll)

0.50 µm (position)

Long-term stability (3h)

< 0.10 µm

Performance Test Results

Pitch deviation after pitch change
P470 - Pitch deviation after pitch variation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Roll deviation after pitch change
P470 - Roll deviation after pitch variation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Pitch deviation after grating lateral translation
P470 - Pitch deviation after grating lateral translation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Roll deviation after grating lateral translation
P470 - Roll deviation after grating lateral translation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Pitch deviation after grating vertical translation
P470 - Pitch deviation after grating vertical translation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Roll deviation after grating vertical translation
P470 - Roll deviation after grating vertical translation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Lateral position deviation after grating
lateral translation
P470 - Lateral position deviation after grating translation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Vertical position deviation after grating
vertical translation
P470 - Height deviation after height variation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Grating pitch stability
P470 - Grating pitch stability - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Grating pitch long-term stability
P470 - Grating pitch long-term stability - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Grating vertical position long-term stability (left)
P470 - Grating vertical (left) position stability - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Grating vertical position long-term stability (right)
P470 - Grating vertical (right) position stability - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Grating lateral position long-term stability
P470 - Grating lateral position stability - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany

Pictures